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News & Press Releases - [Main Index] Anritsu combines BER tester and eye pattern analyser to cut 50% of time and costs 2010-03-23 — Anritsu Launches MP2100A BERTWave Series with Simultaneous, All-in-One BER Measurements and Eye Pattern Analysis —For immediate release - Anritsu Corporation announced the new MP2100A BERTWave series measurement solution for active optical devices. The all-in-one MP2100A performs simultaneous BER measurements and eye pattern analysis of active optical devices. This can cut equipment costs by eliminating the earlier need for separate dedicated instruments. With this release, Anritsu has integrated its long experience in BER and eye pattern analysis technologies into a single powerful solution for measuring BER and analyzing eye patterns simultaneously. Using the MP2100A nearly halves instrument investment costs and measurement times compared to conventional active optical device measurement systems. Development Background Optical communications systems transmit digital data using a combination of active optical devices, such as optical transceivers and optical amplifiers. Evaluation of these devices requires measurement of bit error rates (BER) and analysis of eye patterns—both fields in which Anritsu has always supported the latest measurement technologies. With today’s expanding use of optical communications, makers of optical devices are focusing on cutting manufacturing costs to stay price competitive in the face of increasingly severe business competition. Anritsu has developed its all-in-one MP2100A BERTWave series to help cut manufacturing costs by shortening measurement times for faster throughput, and by halving equipment investment with integrated simultaneous BER measurements and eye pattern analysis into one instrument. Main Functions and Performance
About Anritsu
Jonathan Borrill
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